Inventor
ABADEER WAGDI WILLIAM
US6 patents
Patents
6 patentsUS6731179B2May 4, 2004
System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI)
IBM96 citations96
US7473904B2Jan 6, 2009
Device for monitoring ionizing radiation in silicon-on insulator integrated circuits
IBM5 citations71
US7375339B2May 20, 2008
Monitoring ionizing radiation in silicon-on insulator integrated circuits
IBM8 citations71
US7227239B2Jun 5, 2007
Resettable fuse device and method of fabricating the same
IBM2 citations62
US7545297B2Jun 9, 2009
Digital-to-analog converter using dual-gate transistors
IBM0 citations50
US7545298B2Jun 9, 2009
Design structure for a digital-to-analog converter using dual-gate transistors
IBM0 citations40