Inventor
ANDRES MICHAEL
US27 patents
⚠️ This page may combine multiple inventors who share the name “ANDRES MICHAEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
JOHNSTECH INT CORP
16 patentsUS9274141B1Mar 1, 2016
Low resistance low wear test pin for test contactor
JOHNSTECH INT CORP15 citations92
US9429591B1Aug 30, 2016
On-center electrically conductive pins for integrated testing
JOHNSTECH INT CORP9 citations84
US10725069B1Jul 28, 2020
Integrated circuit contactor for testing ICs and method of construction
JOHNSTECH INT CORP13 citations83
US10114039B1Oct 30, 2018
Selectively geometric shaped contact pin for electronic component testing and method of fabrication
JOHNSTECH INT CORP10 citations79
US10551412B2Feb 4, 2020
Low resistance low wear test pin for test contactor
JOHNSTECH INT CORP2 citations73
US9638714B2May 2, 2017
On-center electrically conductive pins for integrated testing
JOHNSTECH INT CORP2 citations73
US9341649B1May 17, 2016
On-center electrically conductive pins for integrated testing
JOHNSTECH INT CORP3 citations73
US9696347B2Jul 4, 2017
Testing apparatus and method for microcircuit and wafer level IC testing
JOHNSTECH INT CORP2 citations66
US11183783B2Nov 23, 2021
High isolation contactor with test pin and housing for integrated circuit testing
JOHNSTECH INT CORP0 citations62
US11209458B2Dec 28, 2021
Integrated circuit contactor for testing ICs and method of construction
JOHNSTECH INT CORP0 citations60
US11029335B1Jun 8, 2021
Selectively geometric shaped contact pin for electronic component testing and method of fabrication
JOHNSTECH INT CORP0 citations57
US10928423B2Feb 23, 2021
Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings
JOHNSTECH INT CORP0 citations56
US10401386B2Sep 3, 2019
On-center electrically conductive pins for integrated testing
JOHNSTECH INT CORP0 citations52
US9804194B2Oct 31, 2017
Low resistance low wear test pin for test contactor
JOHNSTECH INT CORP0 citations52
US10686269B2Jun 16, 2020
High isolation contactor with test pin and housing for integrated circuit testing
JOHNSTECH INT CORP0 citations51
US10067164B2Sep 4, 2018
Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings
JOHNSTECH INT CORP0 citations45
IBM
4 patentsUS7882389B2Feb 1, 2011
Dynamic reassignment of devices attached to redundant controllers
IBM4 citations59
US9749985B2Aug 29, 2017
Locating computer-controlled entities
IBM0 citations51
US9414351B2Aug 9, 2016
Locating computer-controlled entities
IBM0 citations51
US9219789B2Dec 22, 2015
Locating computer-controlled entities
IBM0 citations51