Inventor
CHO HEUNG-JAE
KR76 patents
⚠️ This page may combine multiple inventors who share the name “CHO HEUNG-JAE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HYNIX SEMICONDUCTOR INC
35 patentsUS6506676B2Jan 14, 2003
Method of manufacturing semiconductor devices with titanium aluminum nitride work function
HYNIX SEMICONDUCTOR INC98 citations98
US7713823B2May 11, 2010
Semiconductor device with vertical channel transistor and method for fabricating the same
HYNIX SEMICONDUCTOR INC33 citations93
US7682911B2Mar 23, 2010
Semiconductor device having a fin transistor and method for fabricating the same
HYNIX SEMICONDUCTOR INC43 citations93
US7217624B2May 15, 2007
Non-volatile memory device with conductive sidewall spacer and method for fabricating the same
HYNIX SEMICONDUCTOR INC16 citations93
US6828185B2Dec 7, 2004
CMOS of semiconductor device and method for manufacturing the same
HYNIX SEMICONDUCTOR INC20 citations93
US6768179B2Jul 27, 2004
CMOS of semiconductor device and method for manufacturing the same
HYNIX SEMICONDUCTOR INC21 citations93
US6734113B1May 11, 2004
Method for forming multiple gate oxide layers
HYNIX SEMICONDUCTOR INC25 citations93
US6642132B2Nov 4, 2003
Cmos of semiconductor device and method for manufacturing the same
HYNIX SEMICONDUCTOR INC25 citations93
US7029999B2Apr 18, 2006
Method for fabricating transistor with polymetal gate electrode
HYNIX SEMICONDUCTOR INC30 citations92
US7112486B2Sep 26, 2006
Method for fabricating semiconductor device by using radical oxidation
HYNIX SEMICONDUCTOR INC47 citations91
US6617212B2Sep 9, 2003
Semiconductor device and method for fabricating the same using damascene process
HYNIX SEMICONDUCTOR INC25 citations90
US7842594B2Nov 30, 2010
Semiconductor device and method for fabricating the same
HYNIX SEMICONDUCTOR INC8 citations84
US7629219B2Dec 8, 2009
Method of fabricating a dual polysilicon gate of a semiconductor device with a multi-plane channel
HYNIX SEMICONDUCTOR INC8 citations84
US7563726B2Jul 21, 2009
Semiconductor device with multiple gate dielectric layers and method for fabricating the same
HYNIX SEMICONDUCTOR INC14 citations84
US7157359B2Jan 2, 2007
Method of forming a metal gate in a semiconductor device using atomic layer deposition process
HYNIX SEMICONDUCTOR INC16 citations84
US7928493B2Apr 19, 2011
Nonvolatile memory device with multiple blocking layers and method of fabricating the same
HYNIX SEMICONDUCTOR INC6 citations74
US7902614B2Mar 8, 2011
Semiconductor device with gate stack structure
HYNIX SEMICONDUCTOR INC4 citations74
US7074661B2Jul 11, 2006
Method for fabricating semiconductor device with use of partial gate recessing process
HYNIX SEMICONDUCTOR INC10 citations74
US6987056B2Jan 17, 2006
Method of forming gates in semiconductor devices
HYNIX SEMICONDUCTOR INC7 citations74
US6448166B2Sep 10, 2002
Method for forming a gate for semiconductor devices
HYNIX SEMICONDUCTOR INC11 citations74
US8053841B2Nov 8, 2011
Semiconductor device having a fin transistor
HYNIX SEMICONDUCTOR INC2 citations63
US8048742B2Nov 1, 2011
Transistor including bulb-type recess channel and method for fabricating the same
HYNIX SEMICONDUCTOR INC4 citations63
US8039337B2Oct 18, 2011
Nonvolatile memory device with multiple blocking layers and method of fabricating the same
HYNIX SEMICONDUCTOR INC3 citations63
US8008178B2Aug 30, 2011
Method for fabricating semiconductor device with an intermediate stack structure
HYNIX SEMICONDUCTOR INC3 citations63
US7994558B2Aug 9, 2011
Method for forming barrier metal layer of bit line in semiconductor memory device
HYNIX SEMICONDUCTOR INC3 citations63
US7875540B2Jan 25, 2011
Method for manufacturing recess gate in a semiconductor device
HYNIX SEMICONDUCTOR INC2 citations63
US7838364B2Nov 23, 2010
Semiconductor device with bulb-type recessed channel and method for fabricating the same
HYNIX SEMICONDUCTOR INC3 citations63
US7816209B2Oct 19, 2010
Method for fabricating semiconductor device
HYNIX SEMICONDUCTOR INC2 citations63
US7781333B2Aug 24, 2010
Semiconductor device with gate structure and method for fabricating the semiconductor device
HYNIX SEMICONDUCTOR INC2 citations63
US7776694B2Aug 17, 2010
Method for fabricating a transistor having vertical channel
HYNIX SEMICONDUCTOR INC5 citations63
US7736975B2Jun 15, 2010
Method for manufacturing non-volatile memory device having charge trap layer
HYNIX SEMICONDUCTOR INC3 citations63
US7687389B2Mar 30, 2010
Method for fabricating semiconductor device
HYNIX SEMICONDUCTOR INC6 citations63
US7579265B2Aug 25, 2009
Method for manufacturing recess gate in a semiconductor device
HYNIX SEMICONDUCTOR INC2 citations63
US7528042B2May 5, 2009
Method for fabricating semiconductor devices having dual gate oxide layer
HYNIX SEMICONDUCTOR INC4 citations63
US7157339B2Jan 2, 2007
Method for fabricating semiconductor devices having dual gate oxide layers
HYNIX SEMICONDUCTOR INC3 citations63
SK HYNIX INC
8 patentsUS9245976B2Jan 26, 2016
Vertical channel transistor with self-aligned gate electrode and method for fabricating the same
SK HYNIX INC5 citations84
US9165924B2Oct 20, 2015
Vertical channel type nonvolatile memory device and method for fabricating the same
SK HYNIX INC5 citations73
US8906775B2Dec 9, 2014
Semiconductor device and method for fabricating the same
SK HYNIX INC6 citations70
US9064854B2Jun 23, 2015
Semiconductor device with gate stack structure
SK HYNIX INC1 citations63
US8895392B2Nov 25, 2014
Method for fabricating semiconductor device
SK HYNIX INC2 citations63
US8796090B2Aug 5, 2014
Semiconductor device with vertical channel transistor and method for fabricating the same
SK HYNIX INC2 citations63
US9236386B2Jan 12, 2016
Semiconductor device with buried bit line and method for fabricating the same
SK HYNIX INC2 citations62
US8936982B2Jan 20, 2015
Semiconductor device with buried bit line and method for fabricating the same
SK HYNIX INC3 citations62
HYUNDAI ELECTRONICS IND
3 patentsUS6664160B2Dec 16, 2003
Gate structure with high K dielectric
HYUNDAI ELECTRONICS IND60 citations96
US6511875B2Jan 28, 2003
Method for making high K dielectric gate for semiconductor device
HYUNDAI ELECTRONICS IND18 citations93
US6248632B1Jun 19, 2001
Method of forming gate electrode with polycide structure in semiconductor device
HYUNDAI ELECTRONICS IND5 citations63
SUNG MIN-GYU
2 patentsCHO HEUNG-JAE
1 patentLIM KWAN-YONG
1 patentShowing the top 50 of 76 patents by PatentIndex Score.