Inventor
ZAYKOVA-FELDMAN LYUDMILA
US10 patents
⚠️ This page may combine multiple inventors who share the name “ZAYKOVA-FELDMAN LYUDMILA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
OMNIPROBE INC
6 patentsUS7414252B2Aug 19, 2008
Method and apparatus for the automated process of in-situ lift-out
OMNIPROBE INC34 citations92
US7834315B2Nov 16, 2010
Method for STEM sample inspection in a charged particle beam instrument
OMNIPROBE INC8 citations83
US7208724B2Apr 24, 2007
Apparatus and method of detecting probe tip contact with a surface
OMNIPROBE INC8 citations73
US7446542B2Nov 4, 2008
Apparatus and method for automated stress testing of flip-chip packages
OMNIPROBE INC2 citations62
USRE46350EMar 28, 2017
Method for stem sample inspection in a charged particle beam instrument
OMNIPROBE INC0 citations51
US7755372B2Jul 13, 2010
Method for automated stress testing of flip-chip packages
OMNIPROBE INC0 citations51
ZAYKOVA-FELDMAN LYUDMILA
3 patentsUS8227781B2Jul 24, 2012
Variable-tilt specimen holder and method and for monitoring milling in a charged-particle instrument
ZAYKOVA-FELDMAN LYUDMILA25 citations91
US8247768B2Aug 21, 2012
Method for stem sample inspection in a charged particle beam instrument
ZAYKOVA-FELDMAN LYUDMILA6 citations82
US8168949B2May 1, 2012
Method for stem sample inspection in a charged particle beam instrument
ZAYKOVA-FELDMAN LYUDMILA1 citations60