Inventor
MOORE THOMAS M
US37 patents
⚠️ This page may combine multiple inventors who share the name “MOORE THOMAS M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
OMNIPROBE INC
17 patentsUS6570170B2May 27, 2003
Total release method for sample extraction from a charged-particle instrument
OMNIPROBE INC93 citations98
US6420722B2Jul 16, 2002
Method for sample separation and lift-out with one cut
OMNIPROBE INC179 citations95
US7644637B2Jan 12, 2010
Method and apparatus for transfer of samples in a controlled environment
OMNIPROBE INC20 citations92
US7414252B2Aug 19, 2008
Method and apparatus for the automated process of in-situ lift-out
OMNIPROBE INC34 citations92
US7315023B2Jan 1, 2008
Method of preparing a sample for examination in a TEM
OMNIPROBE INC13 citations92
US7126132B2Oct 24, 2006
Apparatus for preparing a TEM sample holder
OMNIPROBE INC16 citations92
US7126133B2Oct 24, 2006
Kit for preparing a tem sample holder
OMNIPROBE INC23 citations92
US7115882B2Oct 3, 2006
TEM sample holder
OMNIPROBE INC26 citations92
US6777674B2Aug 17, 2004
Method for manipulating microscopic particles and analyzing
OMNIPROBE INC25 citations91
US7381971B2Jun 3, 2008
Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope
OMNIPROBE INC36 citations87
US7395727B2Jul 8, 2008
Strain detection for automated nano-manipulation
OMNIPROBE INC17 citations84
US7053383B2May 30, 2006
Method and apparatus for rapid sample preparation in a focused ion beam microscope
OMNIPROBE INC13 citations84
US7834315B2Nov 16, 2010
Method for STEM sample inspection in a charged particle beam instrument
OMNIPROBE INC8 citations83
US7446542B2Nov 4, 2008
Apparatus and method for automated stress testing of flip-chip packages
OMNIPROBE INC2 citations62
US7961397B2Jun 14, 2011
Single-channel optical processing system for energetic-beam microscopes
OMNIPROBE INC5 citations60
USRE46350EMar 28, 2017
Method for stem sample inspection in a charged particle beam instrument
OMNIPROBE INC0 citations51
US7755372B2Jul 13, 2010
Method for automated stress testing of flip-chip packages
OMNIPROBE INC0 citations51
TEXAS INSTRUMENTS INC
7 patentsUS5641906AJun 24, 1997
Apparatus and method for automated non-destructive inspection of integrated circuit packages
TEXAS INSTRUMENTS INC24 citations92
US5627320AMay 6, 1997
Apparatus and method for automated non-destructive inspection of integrated circuit packages
TEXAS INSTRUMENTS INC21 citations92
US6435398B2Aug 20, 2002
Method for chemically reworking metal layers on integrated circuit bond pads
TEXAS INSTRUMENTS INC23 citations91
US5046363ASep 10, 1991
Apparatus for rapid non-destructive measurement of die attach quality in packaged integrated circuits
TEXAS INSTRUMENTS INC20 citations82
US6534327B2Mar 18, 2003
Method for reworking metal layers on integrated circuit bond pads
TEXAS INSTRUMENTS INC6 citations73
US6561868B1May 13, 2003
System and method for controlling a polishing machine
TEXAS INSTRUMENTS INC8 citations71
US6821791B2Nov 23, 2004
Method for reworking metal layers on integrated circuit bond pads
TEXAS INSTRUMENTS INC2 citations62
ZAYKOVA-FELDMAN LYUDMILA
3 patentsUS8227781B2Jul 24, 2012
Variable-tilt specimen holder and method and for monitoring milling in a charged-particle instrument
ZAYKOVA-FELDMAN LYUDMILA25 citations91
US8247768B2Aug 21, 2012
Method for stem sample inspection in a charged particle beam instrument
ZAYKOVA-FELDMAN LYUDMILA6 citations82
US8168949B2May 1, 2012
Method for stem sample inspection in a charged particle beam instrument
ZAYKOVA-FELDMAN LYUDMILA1 citations60