Inventor · disambiguated record
Jae-Pil Shin
Also filed as: SHIN JAE-PIL
10 granted patents·3 pending applications·144 citations·filing 2001–2019
86Inventor score
Top patents by PatentIndex Score
13 records- 0195US7844940B2Mask set for microarray, method of fabricating mask set, and method of fabricating microarray using mask setSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Nov 30, 2010·48 cites·18 claims
- 0290US6567964B2Continuously variable dummy pattern density generating systems, methods and computer program products for patterning integrated circuitsSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted May 20, 2003·79 cites·30 claims
- 0385US9116438B2Method of correcting flare and method of preparing extreme ultra violet maskLEE YOUNG-MI·Filed 2012·Granted Aug 25, 2015·8 cites·16 claims
- 0473US7536671B2Mask for forming fine pattern and method of forming the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted May 19, 2009·5 cites·26 claims
- 0570US7610574B2Method and apparatus for designing fine patternSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Oct 27, 2009·3 cites·19 claims
- 0663US10885261B2Systems and methods of fabricating semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jan 5, 2021·0 cites·17 claims
- 0757US10509885B2Systems and methods of fabricating semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Dec 17, 2019·0 cites·20 claims
- 0850US8234595B2Method of designing a mask layoutKIM YOUNG-ILE·Filed 2009·Granted Jul 31, 2012·1 cites·9 claims
- 0942US2013311524A1File Merging System for Merging Layout Input FilesSAMSUNG ELECTRONICS CO LTD·Filed 2013·Application pending·0 cites
- 1037US9798849B2Methods of detecting stresses, methods of training compact models, methods of relaxing stresses, and computing systemsSHIN JAE-PIL·Filed 2015·Granted Oct 24, 2017·0 cites·20 claims
- 1137US2008193863A1Mask set for microarray, method of fabricating mask set, and method of fabricating microarray using mask setSHIN JAE-PIL·Filed 2008·Application pending·0 cites
- 1235US8526707B2Method of inspecting a maskOH YOONNA·Filed 2010·Granted Sep 3, 2013·0 cites·4 claims
- 1335US2007174802A1Method of adjusting pattern densitySHIN JAE-PIL·Filed 2007·Application pending·0 cites
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