Inventor

JIANG PEILIN

US7 patents

⚠️ This page may combine multiple inventors who share the name “JIANG PEILIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SYNOPSYS INC

2 patents

US12481813B2Nov 25, 2025

Test point insertion in analog circuit design testing

SYNOPSYS INC0 citations60

US11669667B2Jun 6, 2023

Automatic test pattern generation (ATPG) for parametric faults

SYNOPSYS INC0 citations59

CHU HANYOU

2 patents

US8762100B1Jun 24, 2014

Numerical aperture integration for optical critical dimension (OCD) metrology

CHU HANYOU2 citations60

US8670948B2Mar 11, 2014

Numerical aperture integration for optical critical dimension (OCD) metrology

CHU HANYOU2 citations59

JIANG PEILIN

1 patent

US9915522B1Mar 13, 2018

Optimized spatial modeling for optical CD metrology

JIANG PEILIN94 citations94

KLA TENCOR CORP

1 patent

US11067389B2Jul 20, 2021

Overlay metrology system and method

KLA TENCOR CORP4 citations72

ILORETA JONATHAN

1 patent

US9127927B2Sep 8, 2015

Techniques for optimized scatterometry

ILORETA JONATHAN5 citations63