Inventor
VYSTAVEL TOMAS
CZ9 patents
Patents
9 patentsUS9837246B1Dec 5, 2017
Reinforced sample for transmission electron microscope
FEI CO16 citations79
US10978272B2Apr 13, 2021
Measurement and endpointing of sample thickness
FEI CO5 citations70
US11650171B2May 16, 2023
Offcut angle determination using electron channeling patterns
FEI CO2 citations67
US11513079B2Nov 29, 2022
Method and system for wafer defect inspection
FEI CO4 citations65
US9741527B2Aug 22, 2017
Specimen holder for a charged particle microscope
FEI CO3 citations62
US11476079B1Oct 18, 2022
Method and system for imaging a multi-pillar sample
FEI CO2 citations61
US12106931B2Oct 1, 2024
Systems and methods for pre-aligning samples for more efficient processing of multiple samples with a Broad Ion Beam (BIB) system
FEI CO0 citations54
US12580150B2Mar 17, 2026
Systems and methods for analyzing a sample using charged particle beams and active pixel control sensors
FEI CO0 citations53
US10105734B2Oct 23, 2018
Method of modifying a sample surface layer from a microscopic sample
FEI CO0 citations39