Inventor

OORSCHOT DOROTHEA MARIA CHRISTINA

NL3 patents

⚠️ This page may combine multiple inventors who share the name “OORSCHOT DOROTHEA MARIA CHRISTINA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ASML NETHERLANDS BV

2 patents

US7992115B2Aug 2, 2011

Overlay measurement on double patterning substrate

ASML NETHERLANDS BV12 citations77

US11668661B2Jun 6, 2023

Inspection tool and inspection method

ASML NETHERLANDS BV0 citations58

VAN DER HEIJDEN EDDY CORNELIS ANTONIUS

1 patent

US8119333B2Feb 21, 2012

Lithographic method

VAN DER HEIJDEN EDDY CORNELIS ANTONIUS0 citations38