Inventor
LAUER ISAAC
US193 patents
⚠️ This page may combine multiple inventors who share the name “LAUER ISAAC”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
34 patentsUS9755017B1Sep 5, 2017
Co-integration of silicon and silicon-germanium channels for nanosheet devices
IBM48 citations98
US9647139B2May 9, 2017
Atomic layer deposition sealing integration for nanosheet complementary metal oxide semiconductor with replacement spacer
IBM34 citations98
US8785981B1Jul 22, 2014
Non-replacement gate nanomesh field effect transistor with pad regions
IBM49 citations98
US9748404B1Aug 29, 2017
Method for fabricating a semiconductor device including gate-to-bulk substrate isolation
IBM32 citations94
US9653547B1May 16, 2017
Integrated etch stop for capped gate and method for manufacturing the same
IBM22 citations94
US9911592B2Mar 6, 2018
Method for making nanosheet CMOS device integrating atomic layer deposition process and replacement gate structure
IBM13 citations93
US8928083B2Jan 6, 2015
Diode structure and method for FINFET technologies
IBM18 citations93
US8900959B2Dec 2, 2014
Non-replacement gate nanomesh field effect transistor with pad regions
IBM18 citations93
US11223347B1Jan 11, 2022
All microwave ZZ control
IBM8 citations85
US10367062B2Jul 30, 2019
Co-integration of silicon and silicon-germanium channels for nanosheet devices
IBM4 citations84
US10217817B2Feb 26, 2019
Sacrificial layer for channel surface retention and inner spacer formation in stacked-channel FETs
IBM7 citations84
US10037885B2Jul 31, 2018
Atomic layer deposition sealing integration for nanosheet complementary metal oxide semiconductor with replacement spacer
IBM6 citations84
US9997613B2Jun 12, 2018
Integrated etch stop for capped gate and method for manufacturing the same
IBM6 citations84
US9812321B2Nov 7, 2017
Method for making nanosheet CMOS device integrating atomic layer deposition process and replacement gate structure
IBM8 citations84
US9812370B2Nov 7, 2017
III-V, SiGe, or Ge base lateral bipolar transistor and CMOS hybrid technology
IBM7 citations84
US9627378B2Apr 18, 2017
Methods of forming FINFETs with locally thinned channels from fins having in-situ doped epitaxial cladding
IBM7 citations84
US9536794B2Jan 3, 2017
Techniques for dual dielectric thickness for a nanowire CMOS technology using oxygen growth
IBM10 citations84
US9496338B2Nov 15, 2016
Wire-last gate-all-around nanowire FET
IBM6 citations84
US9449820B2Sep 20, 2016
Epitaxial growth techniques for reducing nanowire dimension and pitch
IBM7 citations84
US9431301B1Aug 30, 2016
Nanowire field effect transistor (FET) and method for fabricating the same
IBM11 citations84
US9391163B2Jul 12, 2016
Stacked planar double-gate lamellar field-effect transistor
IBM11 citations84
US9373638B1Jun 21, 2016
Complementary metal-oxide silicon having silicon and silicon germanium channels
IBM5 citations84
US9362354B1Jun 7, 2016
Tuning gate lengths in semiconductor device structures
IBM10 citations84
US9209095B2Dec 8, 2015
III-V, Ge, or SiGe fin base lateral bipolar transistor structure and method
IBM18 citations84
US9093379B2Jul 28, 2015
Silicidation blocking process using optically sensitive HSQ resist and organic planarizing layer
IBM7 citations84
US9006087B2Apr 14, 2015
Diode structure and method for wire-last nanomesh technologies
IBM15 citations84
US8994108B2Mar 31, 2015
Diode structure and method for wire-last nanomesh technologies
IBM7 citations84
US8969145B2Mar 3, 2015
Wire-last integration method and structure for III-V nanowire devices
IBM12 citations84
US8927397B2Jan 6, 2015
Diode structure and method for gate all around silicon nanowire technologies
IBM14 citations84
US8901655B2Dec 2, 2014
Diode structure for gate all around silicon nanowire technologies
IBM9 citations84
US8872274B2Oct 28, 2014
Structure for self-aligned silicide contacts to an upside-down FET by epitaxial source and drain
IBM8 citations84
US8802527B1Aug 12, 2014
Gate electrode optimized for low voltage operation
IBM14 citations84
US8796742B1Aug 5, 2014
Non-replacement gate nanomesh field effect transistor with epitixially grown source and drain
IBM9 citations84
US8367485B2Feb 5, 2013
Embedded silicon germanium n-type filed effect transistor for reduced floating body effect
IBM5 citations84
CHANG JOSEPHINE B
9 patentsUS8669615B1Mar 11, 2014
Techniques for metal gate workfunction engineering to enable multiple threshold voltage FINFET devices
CHANG JOSEPHINE B47 citations98
US8673731B2Mar 18, 2014
Techniques for gate workfunction engineering to reduce short channel effects in planar CMOS devices
CHANG JOSEPHINE B19 citations93
US8669167B1Mar 11, 2014
Techniques for metal gate workfunction engineering to enable multiple threshold voltage FINFET devices
CHANG JOSEPHINE B19 citations93
US8658518B1Feb 25, 2014
Techniques for metal gate work function engineering to enable multiple threshold voltage nanowire FET devices
CHANG JOSEPHINE B29 citations93
US8178400B2May 15, 2012
Replacement spacer for tunnel FETs
CHANG JOSEPHINE B21 citations93
US8823064B2Sep 2, 2014
Asymmetric FET formed through use of variable pitch gate for use as logic device and test structure
CHANG JOSEPHINE B7 citations84
US8816327B2Aug 26, 2014
Nanowire efuses
CHANG JOSEPHINE B10 citations84
US8659084B1Feb 25, 2014
Techniques for gate workfunction engineering to reduce short channel effects in planar CMOS devices
CHANG JOSEPHINE B14 citations84
US8659006B1Feb 25, 2014
Techniques for metal gate work function engineering to enable multiple threshold voltage nanowire FET devices
CHANG JOSEPHINE B9 citations84
BANGSARUNTIP SARUNYA
3 patentsUS8809131B2Aug 19, 2014
Replacement gate fin first wire last gate all around devices
BANGSARUNTIP SARUNYA35 citations94
US8324030B2Dec 4, 2012
Nanowire tunnel field effect transistors
BANGSARUNTIP SARUNYA17 citations93
US8173993B2May 8, 2012
Gate-all-around nanowire tunnel field effect transistors
BANGSARUNTIP SARUNYA35 citations93
DORIS BRUCE B
2 patentsCOHEN GUY
1 patentLAUER ISAAC
1 patentShowing the top 50 of 193 patents by PatentIndex Score.