Inventor
BARNHART CARL F
US6 patents
Patents
6 patentsUS6795944B2Sep 21, 2004
Testing regularly structured logic circuits in integrated circuit devices
IBM13 citations81
US7305600B2Dec 4, 2007
Partial good integrated circuit and method of testing same
IBM11 citations80
US6804803B2Oct 12, 2004
Method for testing integrated logic circuits
IBM5 citations61
US7478301B2Jan 13, 2009
Partial good integrated circuit and method of testing same
IBM2 citations59
US4205303AMay 27, 1980
Performing arithmetic using indirect digital-to-analog conversion
IBM4 citations59
US7434129B2Oct 7, 2008
Partial good integrated circuit and method of testing same
IBM3 citations57