Inventor
FUJINAWA GO
JP8 patents
Patents
8 patentsUS6807251B2Oct 19, 2004
X-ray diffraction apparatus
RIGAKU DENKI CO LTD56 citations93
US6307917B1Oct 23, 2001
Soller slit and X-ray apparatus
RIGAKU DENKI CO LTD29 citations92
US6266392B1Jul 24, 2001
Soller slit and manufacturing method of the same
RIGAKU DENKI CO LTD28 citations90
US6917667B2Jul 12, 2005
Method and apparatus for making parallel X-ray beam and X-ray diffraction apparatus
RIGAKU DENKI CO LTD20 citations89
US7542548B2Jun 2, 2009
X-ray optical system
RIGAKU DENKI CO LTD18 citations81
US6990177B2Jan 24, 2006
X-ray optical system for small angle scattering
RIGAKU DENKI CO LTD13 citations81
US7860217B2Dec 28, 2010
X-ray diffraction measuring apparatus having debye-scherrer optical system therein, and an X-ray diffraction measuring method for the same
RIGAKU DENKI CO LTD6 citations60
US11300529B2Apr 12, 2022
Analysis apparatus, analysis method and analysis program
RIGAKU DENKI CO LTD0 citations46