Inventor

MOTOYAMA TAKASHI

JP4 patents

⚠️ This page may combine multiple inventors who share the name “MOTOYAMA TAKASHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOKUHIRO TAKAFUMI

1 patent

US8547279B2Oct 1, 2013

Incoming wave classifying and distinguishing device, incoming wave classifying and distinguishing method, originating position estimating device and originating position estimating method

TOKUHIRO TAKAFUMI3 citations54

TOKYO SEIMITSU CO LTD

1 patent

US9869715B2Jan 16, 2018

Semiconductor wafer inspection apparatus and semiconductor wafer inspection method

TOKYO SEIMITSU CO LTD1 citations46

KELK LTD

1 patent

US12444626B2Oct 14, 2025

Temperature control device for semiconductor wafer and temperature control method for semiconductor wafer

KELK LTD0 citations45

WATANABE AYASE

1 patent

US8693285B2Apr 8, 2014

Sound generation system, ultrasonic wave emitting device, and ultrasonic wave emitting method

WATANABE AYASE1 citations36