Inventor
RAUTH DAVID A
US2 patents
Patents
2 patentsUS9810641B2Nov 7, 2017
Systems and methods for measuring physical characteristics of semiconductor device elements using structured light
KULICKE & SOFFA IND INC7 citations80
US10352877B2Jul 16, 2019
Systems and methods for measuring physical characteristics of semiconductor device elements using structured light
KULICKE & SOFFA IND INC0 citations48