Inventor
YAMASAKI SHINYA
JP36 patents
⚠️ This page may combine multiple inventors who share the name “YAMASAKI SHINYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
24 patentsUS6683007B1Jan 27, 2004
Etching and cleaning methods and etching and cleaning apparatus used therefor
NEC CORP68 citations96
US6387190B1May 14, 2002
Method for cleaning semiconductor wafer after chemical mechanical polishing on copper wiring
NEC CORP45 citations96
US6225217B1May 1, 2001
Method of manufacturing semiconductor device having multilayer wiring
NEC CORP52 citations96
US6140225AOct 31, 2000
Method of manufacturing semiconductor device having multilayer wiring
NEC CORP15 citations74
US5994142ANov 30, 1999
Method for collecting a metallic contaminants from a wafer
NEC CORP15 citations74
US10510218B2Dec 17, 2019
Information processing apparatus, information processing method, and non-transitory storage medium
NEC CORP3 citations72
US12141777B2Nov 12, 2024
Article deduction apparatus, article deduction method, and program
NEC CORP2 citations71
US11922391B2Mar 5, 2024
Article deduction apparatus, article deduction method, and program
NEC CORP1 citations71
US6132592AOct 17, 2000
Method of etching non-doped polysilicon
NEC CORP3 citations63
US10762486B2Sep 1, 2020
Information processing apparatus, information processing method, and non-transitory storage medium
NEC CORP1 citations62
US12299991B2May 13, 2025
Information processing apparatus, information processing method, and program
NEC CORP0 citations61
US12205375B2Jan 21, 2025
Information processing apparatus, information processing method, and program
NEC CORP0 citations61
US12175761B2Dec 24, 2024
Information processing apparatus, information processing method, and program
NEC CORP0 citations61
US12147962B2Nov 19, 2024
Article deduction apparatus, article deduction method, and program
NEC CORP0 citations61
US12141776B2Nov 12, 2024
Article deduction apparatus, article deduction method, and program
NEC CORP0 citations61
US12062238B2Aug 13, 2024
Information processing apparatus, information processing method, and program
NEC CORP0 citations61
US12176112B2Dec 24, 2024
Image processing apparatus, image processing method, and non-transitory computer-readable storage medium
NEC CORP0 citations56
US12062079B2Aug 13, 2024
Information processing apparatus, information processing method, and non-transitory computer readable medium
NEC CORP0 citations52
US11900656B2Feb 13, 2024
Processing apparatus, and processing method
NEC CORP0 citations52
US11587103B2Feb 21, 2023
Object detection system using image recognition, object detection device using image recognition, object detection method using image recognition, and non-transitory storage medium
NEC CORP0 citations52
US11049373B2Jun 29, 2021
Storefront device, storefront management method, and program
NEC CORP0 citations52
US5925213AJul 20, 1999
Wet processing apparatus with movable partitioning plate between two processing chambers
NEC CORP1 citations52
US10824873B2Nov 3, 2020
Information processing apparatus, control method, and program
NEC CORP0 citations51
US12322099B2Jun 3, 2025
Image processing apparatus, image processing method, and non-transitory computer-readable medium
NEC CORP0 citations45
NEC ELECTRONICS CORP
3 patentsUS6964724B2Nov 15, 2005
Etching and cleaning methods and etching and cleaning apparatuses used therefor
NEC ELECTRONICS CORP21 citations92
US6833109B1Dec 21, 2004
Method and apparatus for storing a semiconductor wafer after its CMP polishing
NEC ELECTRONICS CORP16 citations84
US6767409B2Jul 27, 2004
Method for cleaning semiconductor wafer after chemical mechanical polishing on copper wiring
NEC ELECTRONICS CORP8 citations74