Inventor
HÜBNER LUKÁ{HACEK OVER (S)}
CZ3 patents
Patents
3 patentsUS11282670B1Mar 22, 2022
Slice depth reconstruction of charged particle images using model simulation for improved generation of 3D sample images
FEI CO1 citations55
US11264200B1Mar 1, 2022
Lamella alignment based on a reconstructed volume
FEI CO1 citations50
US11380529B2Jul 5, 2022
Depth reconstruction for 3D images of samples in a charged particle system
FEI CO0 citations45