Inventor
TAKAI HIDEYOSHI
JP3 patents
Patents
3 patentsUS7558120B2Jul 7, 2009
Semiconductor integrated circuit device comprising MOS transistor having charge storage layer and method for testing semiconductor memory device
TOSHIBA KK11 citations76
US7694201B2Apr 6, 2010
Semiconductor testing device having test result sending back to generate second data
TOSHIBA KK2 citations54
US7573765B2Aug 11, 2009
Semiconductor memory device
TOSHIBA KK0 citations37