Inventor

MAEKAWA TAKANORI

JP2 patents

Patents

2 patents

US11067493B2Jul 20, 2021

Particle measuring method, sample processing method, and particle imaging apparatus

SYSMEX CORP0 citations54

US11060081B2Jul 13, 2021

Specimen pretreatment apparatus, specimen pretreatment cartridge, and specimen pretreatment method

SYSMEX CORP0 citations46