Inventor
NAGAHARA SEIJI
JP35 patents
⚠️ This page may combine multiple inventors who share the name “NAGAHARA SEIJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOKYO ELECTRON LTD
14 patentsUS10025187B2Jul 17, 2018
Photosensitization chemical-amplification type resist material, method for forming pattern using same, semiconductor device, mask for lithography, and template for nanoimprinting
TOKYO ELECTRON LTD8 citations83
US9618848B2Apr 11, 2017
Methods and techniques to use with photosensitized chemically amplified resist chemicals and processes
TOKYO ELECTRON LTD12 citations83
US9519227B2Dec 13, 2016
Metrology for measurement of photosensitizer concentration within photo-sensitized chemically-amplified resist (PS-CAR)
TOKYO ELECTRON LTD12 citations83
US10429745B2Oct 1, 2019
Photo-sensitized chemically amplified resist (PS-CAR) simulation
TOKYO ELECTRON LTD3 citations72
US10025190B2Jul 17, 2018
Substrate treatment system
TOKYO ELECTRON LTD2 citations71
US11163236B2Nov 2, 2021
Method and process for stochastic driven detectivity healing
TOKYO ELECTRON LTD2 citations68
US10274843B2Apr 30, 2019
Exposure apparatus, exposure method and storage medium
TOKYO ELECTRON LTD1 citations57
US11353793B2Jun 7, 2022
Method of simulating resist pattern, resist material and method of optimizing formulation thereof, apparatus and recording medium
TOKYO ELECTRON LTD0 citations52
US11061332B2Jul 13, 2021
Methods for sensitizing photoresist using flood exposures
TOKYO ELECTRON LTD0 citations52
US10534266B2Jan 14, 2020
Methods and techniques to use with photosensitized chemically amplified resist chemicals and processes
TOKYO ELECTRON LTD0 citations51
US10101669B2Oct 16, 2018
Exposure apparatus, resist pattern forming method, and storage medium
TOKYO ELECTRON LTD0 citations40
US10527948B2Jan 7, 2020
Optical processing apparatus, coating/development apparatus, optical processing method, and non-transitory computer-readable storage medium
TOKYO ELECTRON LTD0 citations38
US10747121B2Aug 18, 2020
Optical processing apparatus and substrate processing apparatus
TOKYO ELECTRON LTD0 citations37
US10558125B2Feb 11, 2020
Exposure apparatus, exposure apparatus adjustment method and storage medium
TOKYO ELECTRON LTD0 citations37
NICHIA CORP
8 patentsUS10951004B2Mar 16, 2021
Light source device
NICHIA CORP2 citations73
US11029591B2Jun 8, 2021
Light source device and optical engine
NICHIA CORP1 citations62
US9459520B2Oct 4, 2016
Light source unit and optical engine
NICHIA CORP2 citations60
US10133163B2Nov 20, 2018
Light source unit and optical engine
NICHIA CORP1 citations52
US9500936B2Nov 22, 2016
Light source device, and optical engine in which light source device is used
NICHIA CORP0 citations52
US9709882B2Jul 18, 2017
Light source apparatus and projector having light source apparatus
NICHIA CORP0 citations49
US10396262B2Aug 27, 2019
Light emitting device and substrate
NICHIA CORP0 citations41
US10215362B2Feb 26, 2019
Light source apparatus with lens array
NICHIA CORP0 citations41
NEC ELECTRONICS CORP
7 patentsUS7479361B2Jan 20, 2009
Chemically amplified resist composition, process for manufacturing semiconductor device and patterning process
NEC ELECTRONICS CORP19 citations92
US6800551B2Oct 5, 2004
Chemical amplification type photoresist composition, method for producing a semiconductor device using the composition, and semiconductor substrate
NEC ELECTRONICS CORP24 citations92
US7396633B2Jul 8, 2008
Chemically amplified resist composition and manufacturing method of semiconductor integrated circuit device with such chemically amplified resist composition
NEC ELECTRONICS CORP11 citations84
US7217654B2May 15, 2007
Semiconductor device and method of manufacturing the same
NEC ELECTRONICS CORP18 citations83
US7534554B2May 19, 2009
Chemically amplified resist composition and manufacturing method of semiconductor integrated circuit device with such chemically amplified resist composition
NEC ELECTRONICS CORP6 citations74
US6774028B2Aug 10, 2004
Method of forming wiring structure by using photo resist having optimum development rate
NEC ELECTRONICS CORP2 citations62
US7440077B2Oct 21, 2008
Exposure apparatus
NEC ELECTRONICS CORP0 citations52
UNIV OSAKA
3 patentsUS10073349B2Sep 11, 2018
Chemically amplified resist material, pattern-forming method, compound, and production method of compound
UNIV OSAKA2 citations62
US10073348B2Sep 11, 2018
Resist-pattern-forming method and chemically amplified resist material
UNIV OSAKA0 citations41
US9971247B2May 15, 2018
Pattern-forming method
UNIV OSAKA0 citations41