P

Inventor

KLIPP ANDREAS

DE31 patents
⚠️ This page may combine multiple inventors who share the name “KLIPP ANDREAS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BASF SE

19 patents
US10647900B2May 12, 2020

Chemical-mechanical polishing composition comprising benzotriazole derivatives as corrosion inhibitors

BASF SE3 citations72
US10538724B2Jan 21, 2020

Defect reduction rinse solution containing ammonium salts of sulfoesters

BASF SE3 citations72
US9557652B2Jan 31, 2017

Use of compositions comprising a surfactant and a hydrophobizer for avoiding anti pattern collapse when treating patterned materials with line-space dimensions of 50 nm or below

BASF SE3 citations72
US11180719B2Nov 23, 2021

Use of compositions comprising a siloxane-type additive for avoiding pattern collapse when treating patterned materials with line-space dimensions of 50 nm or below

BASF SE2 citations68
US11168239B2Nov 9, 2021

Chemical-mechanical polishing composition comprising benzotriazole derivatives as corrosion inhibitors

BASF SE0 citations61
US12525464B2Jan 13, 2026

Use of a composition and a process for selectively etching silicon

BASF SE0 citations55
US9223221B2Dec 29, 2015

Photoresist stripping and cleaning composition, method of its preparation and its use

BASF SE0 citations51
US11742197B2Aug 29, 2023

Cleavable additives for use in a method of making a semiconductor substrate

BASF SE0 citations50
US10844325B2Nov 24, 2020

Composition for post chemical-mechanical-polishing cleaning

BASF SE0 citations48
US9891520B2Feb 13, 2018

Use of surfactants having at least three short-chain perfluorinated groups in formulations for photo mask cleaning

BASF SE1 citations48
US10865361B2Dec 15, 2020

Composition for post chemical-mechanical-polishing cleaning

BASF SE0 citations47
US12024693B2Jul 2, 2024

Imidazolidinethione-containing compositions for post-ash residue removal and/or for oxidative etching of a layer or mask comprising TiN

BASF SE0 citations46
US11377624B2Jul 5, 2022

Cleaning composition for post-etch or post ash residue removal from a semiconductor substrate and corresponding manufacturing process

BASF SE0 citations46
US12518960B2Jan 6, 2026

Composition comprising a siloxane and an alkane for avoiding pattern collapse when treating patterned materials with line-space dimensions of 50 NM or below

BASF SE0 citations45
US12331239B2Jun 17, 2025

Composition and process for selectively etching a layer comprising an aluminium compound in the presence of layers of low-k materials, copper and/or cobalt

BASF SE0 citations45
US12590274B2Mar 31, 2026

Composition and process for selectively etching a hard mask and/or an etch-stop layer in the presence of layers of low-k materials, copper, cobalt and/or tungsten

BASF SE0 citations44
US10385295B2Aug 20, 2019

Compositions for anti pattern collapse treatment comprising gemini additives

BASF SE0 citations41
US12084628B2Sep 10, 2024

Composition comprising a primary and a secondary surfactant, for cleaning or rinsing a product

BASF SE0 citations39
US10844333B2Nov 24, 2020

Composition for post chemical-mechanical-polishing cleaning

BASF SE0 citations36

KLIPP ANDREAS

6 patents

MELLIES RAIMUND

2 patents

INFINEON TECHNOLOGIES AG

1 patent

BRAUN SIMON

1 patent

QIMONDA AG

1 patent

CHEN CHIENSHIN

1 patent