Inventor
BENWARE ROBERT B
US7 patents
⚠️ This page may combine multiple inventors who share the name “BENWARE ROBERT B”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LSI LOGIC CORP
3 patentsUS7058909B2Jun 6, 2006
Method of generating an efficient stuck-at fault and transition delay fault truncated scan test pattern for an integrated circuit design
LSI LOGIC CORP12 citations78
US7216280B2May 8, 2007
Method of generating test patterns to efficiently screen inline resistance delay defects in complex ASICs
LSI LOGIC CORP5 citations70
US7171638B2Jan 30, 2007
Methods of screening ASIC defects using independent component analysis of quiescent current measurements
LSI LOGIC CORP1 citations45
LSI CORP
2 patentsUS7617427B2Nov 10, 2009
Method and apparatus for detecting defects in integrated circuit die from stimulation of statistical outlier signatures
LSI CORP7 citations70
US7395478B2Jul 1, 2008
Method of generating test patterns to efficiently screen inline resistance delay defects in complex asics
LSI CORP0 citations48