Inventor
HORINOUCHI Kento
JP3 patents
Patents
3 patentsUS12080511B2Sep 3, 2024
Sample holder, method for using sample holder, projection amount adjustment jig, projection amount adjustment method and charged particle beam device
HITACHI HIGH TECH CORP0 citations58
US9761412B2Sep 12, 2017
Ion milling apparatus and sample processing method
HITACHI HIGH TECH CORP0 citations48
US10269534B2Apr 23, 2019
Mask position adjustment method of ion milling, electron microscope capable of adjusting mask position, mask adjustment device mounted on sample stage and sample mask component of ion milling device
HITACHI HIGH TECH CORP0 citations47