Inventor
HAWTHORNE JEFFREY ALAN
US12 patents
⚠️ This page may combine multiple inventors who share the name “HAWTHORNE JEFFREY ALAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
QCEPT TECHNOLOGIES INC
11 patentsUS7634365B2Dec 15, 2009
Inspection system and apparatus
QCEPT TECHNOLOGIES INC16 citations91
US7107158B2Sep 12, 2006
Inspection system and apparatus
QCEPT TECHNOLOGIES INC18 citations91
US6957154B2Oct 18, 2005
Semiconductor wafer inspection system
QCEPT TECHNOLOGIES INC14 citations82
US7337076B2Feb 26, 2008
Inspection system and apparatus
QCEPT TECHNOLOGIES INC6 citations72
US7092826B2Aug 15, 2006
Semiconductor wafer inspection system
QCEPT TECHNOLOGIES INC6 citations72
US7308367B2Dec 11, 2007
Wafer inspection system
QCEPT TECHNOLOGIES INC7 citations71
US7103482B2Sep 5, 2006
Inspection system and apparatus
QCEPT TECHNOLOGIES INC10 citations71
US7659734B2Feb 9, 2010
Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illumination
QCEPT TECHNOLOGIES INC7 citations69
US7379826B2May 27, 2008
Semiconductor wafer inspection system
QCEPT TECHNOLOGIES INC3 citations61
US7152476B2Dec 26, 2006
Measurement of motions of rotating shafts using non-vibrating contact potential difference sensor
QCEPT TECHNOLOGIES INC5 citations61
US7900526B2Mar 8, 2011
Defect classification utilizing data from a non-vibrating contact potential difference sensor
QCEPT TECHNOLOGIES INC2 citations58