Inventor

BYUN EUN-JO

KR3 patents

⚠️ This page may combine multiple inventors who share the name “BYUN EUN-JO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LEE SANG-HOON

1 patent

US8606102B2Dec 10, 2013

Test interface device, test system and optical interface memory device

LEE SANG-HOON4 citations58

SAMSUNG ELECTRONICS CO LTD

1 patent

US7973550B2Jul 5, 2011

Semiconductor device test apparatus including interface unit and method of testing semiconductor device using the same

SAMSUNG ELECTRONICS CO LTD3 citations58

OH SE-JANG

1 patent

US8674718B2Mar 18, 2014

Built off testing apparatus

OH SE-JANG2 citations51