Inventor

CHOI JONG-HYUN

KR260 patents

⚠️ This page may combine multiple inventors who share the name “CHOI JONG-HYUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CHOI JONG-HYUN

SAMSUNG ELECTRONICS CO LTD

System and method for performing partial array self-refresh operation in a semiconductor memory device

System and method for performing partial array self-refresh operation in a semiconductor memory device

Semiconductor memory device having a refresh function and a method for refreshing the same

Power down voltage control method and apparatus

DRAM capable of selectively performing self-refresh operation for memory bank

DRAM device with a refresh period that varies responsive to a temperature signal having a hysteresis characteristic

Internal reference voltage generating circuit for reducing standby current and semiconductor memory device including the same

Circuit and method for selecting reference voltages in semiconductor memory device

Layout method for bit line sense amplifier driver

Semiconductor memory device and method of identifying programmed defective address thereof

Integrated circuit memory devices with improved layout of fuse boxes and buses

Semiconductor memory device with on-chip boosted power supply voltage generator

Low noise sense amplifier control circuits for dynamic random access memories and related methods

Word line loading compensating circuit of semiconductor memory device

Driver circuits for integrated circuit devices that are operable to reduce gate induced drain leakage (GIDL) current in a transistor and methods of operating the same

System and method for performing partial array self-refresh operation in a semiconductor memory device

Semiconductor memory device having an internal voltage generation circuit for selectively generating an internal voltage according to an external voltage level

Power down voltage control method and apparatus

Wafer burn-in test circuit and method for testing a semiconductor memory device

Wafer burn-in test circuit and method for testing a semiconductor memory

Semiconductor memory device with a fully accessible redundant memory cell array

Semiconductor devices including an external power voltage control function and methods of operating the same

Semiconductor memory device having sub dummy bit line and sub dummy word line

SAMSUNG DISPLAY CO LTD

Display module

Display module

Bending support for display panel

Display device

Display device and electronic watch including the same

Organic light emitting display device

Display module

Display module

Cover window for a display device

Display device

Display device having data line interconnections in a display area

Bending support for display panel

Bending support for display panel

Display device

Display device having data lines in rounded edge and straight edge parts

Display device

Display device

Display device

Display device and electronic watch including the same

Display device

Display device

CHOI JONG-HYUN

Organic light emitting diode display and method of manufacturing the same

CMOS thin film transistor, method of fabricating the same and organic light emitting display device having laminated PMOS poly-silicon thin film transistor with a top gate configuration and a NMOS oxide thin film transistor with an inverted staggered bottom gate configuration

Organic light emitting diode display and method of manufacturing the same

KIM YOUNG-DAE

Organic light emitting display device

NOH KWANG-SOOK

Methods of operating DRAM devices having adjustable internal refresh cycles that vary in response to on-chip temperature changes

LG PHILIPS LCD CO LTD

Backlight device and method of fabricating the same