Inventor
YOU HO SANG
KR4 patents
Patents
4 patentsUS11031091B2Jun 8, 2021
Apparatus and method for measuring round-trip time of test signal using programmable logic
UNITEST INC0 citations42
US9312030B2Apr 12, 2016
Apparatus and method for acquiring data of fast fail memory
UNITEST INC0 citations42
US9378845B2Jun 28, 2016
System for simultaneously determining memory test result
UNITEST INC0 citations31
US9197212B2Nov 24, 2015
Apparatus and method for correcting output signal of FPGA-based memory test device
UNITEST INC0 citations31