Inventor · disambiguated record
Georg Fantner
Also filed as: FANTNER GEORG · FANTNER GEORG E · FANTNER GEORG ERNEST
8 granted patents·2 pending applications·34 citations·filing 2004–2023
83Inventor score
Files withECOLE POLYTECHNIQUE FED LAUSANNE EPFL3UNIV CALIFORNIA3HANSMA PAUL K2GETEC MICROSCOPY GMBH1MASSACHUSETTS INST TECHNOLOGY1
Top patents by PatentIndex Score
10 records- 0174US11112426B2Method and device of using a scanning probe microscopeECOLE POLYTECHNIQUE FED LAUSANNE EPFL·Filed 2016·Granted Sep 7, 2021·2 cites·14 claims
- 0271US7878987B2Methods and instruments for assessing bone fracture riskUNIV CALIFORNIA·Filed 2006·Granted Feb 1, 2011·10 cites·16 claims
- 0368US8398568B2Methods and instruments for assessing bone fracture riskHANSMA PAUL K·Filed 2011·Granted Mar 19, 2013·7 cites·16 claims
- 0468US7555941B2Scanner for probe microscopyUNIV CALIFORNIA·Filed 2007·Granted Jul 7, 2009·3 cites·9 claims
- 0565US7278298B2Scanner for probe microscopyUNIV CALIFORNIA·Filed 2004·Granted Oct 9, 2007·11 cites·25 claims
- 0661US2025376725A1Nanopore-based scanning system and methodECOLE POLYTECHNIQUE FED LAUSANNE EPFL·Filed 2023·Application pending·0 cites
- 0756US8347409B2Resonance compensation in scanning probe microscopyMASSACHUSETTS INST TECHNOLOGY·Filed 2010·Granted Jan 1, 2013·1 cites·33 claims
- 0843US2013204164A1Methods and instruments for assessing bone fracture riskHANSMA PAUL K·Filed 2013·Application pending·0 cites
- 0941US10866262B2Multi-axis positioning deviceGETEC MICROSCOPY GMBH·Filed 2018·Granted Dec 15, 2020·0 cites·28 claims
- 1038US10308500B2Multilayer MEMS cantileversECOLE POLYTECHNIQUE FED LAUSANNE EPFL·Filed 2016·Granted Jun 4, 2019·0 cites·17 claims
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