Inventor

LAM JOHN C

US3 patents

⚠️ This page may combine multiple inventors who share the name “LAM JOHN C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

N & K TECHNOLOGY INC

2 patents

US6710865B2Mar 23, 2004

Method of inferring optical parameters outside of a measurement spectral range

N & K TECHNOLOGY INC39 citations88

US6594025B2Jul 15, 2003

Method of monitoring thin-film processes and metrology tool thereof

N & K TECHNOLOGY INC24 citations88

N&K TECH INC

1 patent

US9513112B1Dec 6, 2016

Three dimensional characterization of silicon wafer Vias from combined on-top microscopic and bottom-through laser fringes measurement

N&K TECH INC4 citations60