Inventor
PARK HWAN-WOOK
KR9 patents
⚠️ This page may combine multiple inventors who share the name “PARK HWAN-WOOK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
7 patentsUS7673209B2Mar 2, 2010
Test pattern generating circuit and semiconductor memory device having the same
SAMSUNG ELECTRONICS CO LTD8 citations82
US7681097B2Mar 16, 2010
Test system employing test controller compressing data, data compressing circuit and test method
SAMSUNG ELECTRONICS CO LTD8 citations81
US7692998B2Apr 6, 2010
Circuit of detecting power-up and power-down
SAMSUNG ELECTRONICS CO LTD7 citations72
US7498847B2Mar 3, 2009
Output driver that operates both in a differential mode and in a single mode
SAMSUNG ELECTRONICS CO LTD5 citations60
US10891988B2Jan 12, 2021
Memory modules and memory systems including a power management integrated circuit
SAMSUNG ELECTRONICS CO LTD1 citations58
US10410686B2Sep 10, 2019
Memory modules storing a trimming control code associated with a minimum level of a power supply voltage, methods of operating the memory modules, and test systems of the memory modules
SAMSUNG ELECTRONICS CO LTD1 citations58
US7802154B2Sep 21, 2010
Method and apparatus for generating high-frequency command and address signals for high-speed semiconductor memory device testing
SAMSUNG ELECTRONICS CO LTD1 citations49