Inventor
TSUKAHARA HIROYUKI
JP12 patents
Patents
12 patentsUS4805224AFeb 14, 1989
Pattern matching method and apparatus
FUJITSU LTD83 citations96
US4651341AMar 17, 1987
Pattern recognition apparatus and a pattern recognition method
FUJITSU LTD83 citations96
US5004929AApr 2, 1991
Optical system for detecting three-dimensional shape
FUJITSU LTD73 citations93
US5298989AMar 29, 1994
Method of and apparatus for multi-image inspection of bonding wire
FUJITSU LTD36 citations92
US4672678AJun 9, 1987
Pattern recognition apparatus
FUJITSU LTD53 citations92
US6555836B1Apr 29, 2003
Method and apparatus for inspecting bumps and determining height from a regular reflection region
FUJITSU LTD22 citations91
US6052189AApr 18, 2000
Height measurement device and height measurement method
FUJITSU LTD32 citations91
US5999266ADec 7, 1999
Method for inspecting height, and a height inspection apparatus to carry out the method
FUJITSU LTD48 citations91
US7443516B2Oct 28, 2008
Optical-distortion correcting apparatus and optical-distortion correcting method
FUJITSU LTD7 citations72
US6104493AAug 15, 2000
Method and apparatus for visual inspection of bump array
FUJITSU LTD9 citations72
US5243406ASep 7, 1993
Method and apparatus for measuring three-dimensional configuration of wire-shaped object in a short time
FUJITSU LTD16 citations72
US7593596B2Sep 22, 2009
Phase unwrapping method, program, and interference measurement apparatus
FUJITSU LTD4 citations61