Inventor
FRANKEN ERIK
NL8 patents
Patents
8 patentsUS11151356B2Oct 19, 2021
Using convolution neural networks for on-the-fly single particle reconstruction
FEI CO2 citations71
US11756762B2Sep 12, 2023
Rotating sample holder for random angle sampling in tomography
FEI CO2 citations70
US11257656B2Feb 22, 2022
Rotating sample holder for random angle sampling in tomography
FEI CO3 citations70
US11990315B2May 21, 2024
Measurement and correction of optical aberrations in charged particle beam microscopy
FEI CO0 citations60
US12074007B2Aug 27, 2024
Rotating sample holder for random angle sampling in tomography
FEI CO0 citations59
US12327342B2Jun 10, 2025
Automatic particle beam focusing
FEI CO0 citations56
US11887809B2Jan 30, 2024
Auto-tuning stage settling time with feedback in charged particle microscopy
FEI CO0 citations56
US12567165B2Mar 3, 2026
Critical dimension measurement in 3D with geometric models
FEI CO0 citations55