Inventor
CHEN HSIN-PAI
TW6 patents
Patents
6 patentsUS5783366AJul 21, 1998
Method for eliminating charging of photoresist on specimens during scanning electron microscope examination
TAIWAN SEMICONDUCTOR MFG24 citations88
US6143618ANov 7, 2000
Procedure for elimating flourine degradation of WSix /oxide/polysilicon capacitors
TAIWAN SEMICONDUCTOR MFG10 citations67
US5658821AAug 19, 1997
Method of improving uniformity of metal-to-poly capacitors composed by polysilicon oxide and avoiding device damage
TAIWAN SEMICONDUCTOR MFG8 citations67
US6159660ADec 12, 2000
Opposite focus control to avoid keyholes inside a passivation layer
TAIWAN SEMICONDUCTOR MFG2 citations61
US6161053ADec 12, 2000
In-situ binary PCM code indentifier to verify a ROM code id during processing
TAIWAN SEMICONDUCTOR MFG3 citations56
US5739059AApr 14, 1998
Method of forming a semiconductor device having high and low resistance polysilicon
TAIWAN SEMICONDUCTOR MFG5 citations56