Inventor

KONONCHUK OLEG V

US17 patents

⚠️ This page may combine multiple inventors who share the name “KONONCHUK OLEG V”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KONONCHUK OLEG V

SEH AMERICA INC

Method of determining the thickness of a layer on a silicon substrate

Growth of epitaxial semiconductor material with improved crystallographic properties

Method of processing the backside of a wafer within an epitaxial reactor chamber

Growth of epitaxial semiconductor material with improved crystallographic properties

System and method for wafer thickness sorting

Method of effecting nitrogen doping in Czochralski grown silicon crystal

Apparatus and method for reducing bow and warp in silicon wafers sliced by a wire saw

Method of producing a high resistivity SIMOX silicon substrate

High resistivity silicon wafer having electrically inactive dopant and method of producing same

In-situ post epitaxial treatment process

Method of producing a high resistivity silicon wafer utilizing heat treatment that occurs during device fabrication

High resistivity silicon wafer with thick epitaxial layer and method of producing same

High resistivity silicon wafer and method of producing same using the magnetic field Czochralski method

Growth of epitaxial semiconductor material with improved crystallographic properties

Method of demounting silicon wafers after polishing

High resistivity silicon wafer produced by a controlled pull rate czochralski method

SEH AMERICA

Low cost silicon substrate with impurity gettering and latch up protection and method of manufacture