Inventor
SON TAE-SIK
KR6 patents
⚠️ This page may combine multiple inventors who share the name “SON TAE-SIK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
5 patentsUS6657915B2Dec 2, 2003
Wordline driver for ensuring equal stress to wordlines in multi row address disturb test and method of driving the wordline driver
SAMSUNG ELECTRONICS CO LTD37 citations85
US7616020B2Nov 10, 2009
Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device
SAMSUNG ELECTRONICS CO LTD5 citations70
US7880493B2Feb 1, 2011
Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device
SAMSUNG ELECTRONICS CO LTD2 citations59
US7476983B2Jan 13, 2009
Semiconductor device including wire bonding pads and pad layout method
SAMSUNG ELECTRONICS CO LTD2 citations59
US6961282B2Nov 1, 2005
Semiconductor memory device with driving circuits for screening defective wordlines and related methods
SAMSUNG ELECTRONICS CO LTD6 citations59