Inventor
SASAKI YUKO
US43 patents
⚠️ This page may combine multiple inventors who share the name “SASAKI YUKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
25 patentsUS7875858B2Jan 25, 2011
Charged particle beam trajectory corrector and charged particle beam apparatus
HITACHI HIGH TECH CORP13 citations84
US7728294B2Jun 1, 2010
Semiconductor wafer inspection tool and semiconductor wafer inspection method
HITACHI HIGH TECH CORP18 citations84
US7872240B2Jan 18, 2011
Corrector for charged-particle beam aberration and charged-particle beam apparatus
HITACHI HIGH TECH CORP7 citations83
US7241996B2Jul 10, 2007
Charged particle beam apparatus
HITACHI HIGH TECH CORP8 citations74
US10319558B2Jun 11, 2019
Charged particle beam device
HITACHI HIGH TECH CORP2 citations73
US10991542B2Apr 27, 2021
Charged particle beam device
HITACHI HIGH TECH CORP2 citations72
US9305745B2Apr 5, 2016
Scanning electron microscope
HITACHI HIGH TECH CORP3 citations72
US9159529B2Oct 13, 2015
Scanning electron microscope
HITACHI HIGH TECH CORP3 citations63
US7947964B2May 24, 2011
Charged particle beam orbit corrector and charged particle beam apparatus
HITACHI HIGH TECH CORP6 citations63
US7435960B2Oct 14, 2008
Charged particle beam apparatus
HITACHI HIGH TECH CORP2 citations63
US7425702B2Sep 16, 2008
Charged particle beam apparatus
HITACHI HIGH TECH CORP2 citations63
US12394586B2Aug 19, 2025
Charged particle beam device
HITACHI HIGH TECH CORP0 citations62
US10566172B2Feb 18, 2020
Charged particle beam apparatus and method for adjusting imaging conditions for the same
HITACHI HIGH TECH CORP1 citations61
US12334299B2Jun 17, 2025
Charged particle beam device
HITACHI HIGH TECH CORP0 citations56
US9941095B2Apr 10, 2018
Charged particle beam apparatus
HITACHI HIGH TECH CORP1 citations52
US9318299B2Apr 19, 2016
Charged particle beam device having an energy filter
HITACHI HIGH TECH CORP1 citations52
US7714289B2May 11, 2010
Charged particle beam apparatus
HITACHI HIGH TECH CORP0 citations52
US10770266B2Sep 8, 2020
Charged particle beam device and capturing condition adjusting method in charged particle beam device
HITACHI HIGH TECH CORP0 citations51
US9960006B2May 1, 2018
Charged-particle-beam device
HITACHI HIGH TECH CORP1 citations51
US11898968B2Feb 13, 2024
Inspection apparatus adjustment system and inspection apparatus adjustment method
HITACHI HIGH TECH CORP0 citations50
US7935925B2May 3, 2011
Charged particle beam scanning method and charged particle beam apparatus
HITACHI HIGH TECH CORP1 citations49
US12573586B2Mar 10, 2026
Charged particle beam apparatus
HITACHI HIGH TECH CORP0 citations48
US11152186B2Oct 19, 2021
Charged particle beam device
HITACHI HIGH TECH CORP0 citations47
US10692687B2Jun 23, 2020
Measurement and inspection device
HITACHI HIGH TECH CORP0 citations42
US10707047B2Jul 7, 2020
Measuring device and measuring method
HITACHI HIGH TECH CORP0 citations41
HITACHI LTD
5 patentsUS6583413B1Jun 24, 2003
Method of inspecting a circuit pattern and inspecting instrument
HITACHI LTD123 citations99
US7098455B2Aug 29, 2006
Method of inspecting a circuit pattern and inspecting instrument
HITACHI LTD26 citations93
US7397031B2Jul 8, 2008
Method of inspecting a circuit pattern and inspecting instrument
HITACHI LTD10 citations84
US4610732ASep 9, 1986
Method of inhibiting corrosion of zirconium or its alloy
HITACHI LTD18 citations82
US5190623AMar 2, 1993
Nuclear fuel reprocessing plant
HITACHI LTD11 citations72
SEIKO INSTR INC
4 patentsUS6088300AJul 11, 2000
Calendar electronic timepiece
SEIKO INSTR INC23 citations91
US6584040B1Jun 24, 2003
Electronic timepiece
SEIKO INSTR INC9 citations72
US6582118B1Jun 24, 2003
Electronic timepiece having transmission wheel rotational position detecting apparatus
SEIKO INSTR INC7 citations72
US6088302AJul 11, 2000
Electronic timepiece
SEIKO INSTR INC7 citations72