Inventor · disambiguated record
Hugh W. Littlebury
Also filed as: LITTLEBURY HUGH · LITTLEBURY HUGH W
15 granted patents·1,317 citations·filing 1984–2010
95Inventor score
Top patents by PatentIndex Score
15 records- 0198US5012187AMethod for parallel testing of semiconductor devicesMOTOROLA INC·Filed 1989·Granted Apr 30, 1991·251 cites·8 claims
- 0297US5177438ALow resistance probe for semiconductorMOTOROLA INC·Filed 1991·Granted Jan 5, 1993·324 cites·18 claims
- 0396US4968931AApparatus and method for burning in integrated circuit wafersMOTOROLA INC·Filed 1989·Granted Nov 6, 1990·237 cites·13 claims
- 0493US4985988AMethod for assembling, testing, and packaging integrated circuitsMOTOROLA INC·Filed 1989·Granted Jan 22, 1991·143 cites·11 claims
- 0590US5256578AIntegral semiconductor wafer map recordingMOTOROLA INC·Filed 1991·Granted Oct 26, 1993·142 cites·8 claims
- 0687US4989209AMethod and apparatus for testing high pin count integrated circuitsMOTOROLA INC·Filed 1989·Granted Jan 29, 1991·51 cites·12 claims
- 0786US5008615AMeans and method for testing integrated circuits attached to a leadframeMOTOROLA INC·Filed 1989·Granted Apr 16, 1991·47 cites·9 claims
- 0871US7532027B2Deliberate destruction of integrated circuitsADTRON INC·Filed 2007·Granted May 12, 2009·8 cites·25 claims
- 0971US4972413AMethod and apparatus for high speed integrated circuit testingMOTOROLA INC·Filed 1989·Granted Nov 20, 1990·27 cites·11 claims
- 1070US8149012B2Deliberate destruction of integrated circuitsLAZARAVICH ROBERT·Filed 2010·Granted Apr 3, 2012·3 cites·19 claims
- 1165US4604744AAutomated circuit testerMOTOROLA INC·Filed 1984·Granted Aug 5, 1986·18 cites·23 claims
- 1261US5233510AContinuously self configuring distributed control systemMOTOROLA INC·Filed 1991·Granted Aug 3, 1993·25 cites·12 claims
- 1359US5142449AForming isolation resistors with resistive elastomersMOTOROLA INC·Filed 1990·Granted Aug 25, 1992·24 cites·10 claims
- 1453US7804319B2Deliberate destruction of integrated circuitsADTRON CORP·Filed 2009·Granted Sep 28, 2010·0 cites·20 claims
- 1551US4928002AMethod of recording test results of die on a waferMOTOROLA INC·Filed 1988·Granted May 22, 1990·17 cites·7 claims
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