Inventor
SHIAU GWO-YUH
TW26 patents
⚠️ This page may combine multiple inventors who share the name “SHIAU GWO-YUH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG
17 patentsUS6645851B1Nov 11, 2003
Method of forming planarized coatings on contact hole patterns of various duty ratios
TAIWAN SEMICONDUCTOR MFG98 citations96
US7709872B2May 4, 2010
Methods for fabricating image sensor devices
TAIWAN SEMICONDUCTOR MFG16 citations93
US7648851B2Jan 19, 2010
Method of fabricating backside illuminated image sensor
TAIWAN SEMICONDUCTOR MFG46 citations93
US7883917B2Feb 8, 2011
Semiconductor device with bonding pad
TAIWAN SEMICONDUCTOR MFG20 citations92
US7659595B2Feb 9, 2010
Embedded bonding pad for backside illuminated image sensor
TAIWAN SEMICONDUCTOR MFG25 citations92
US6803291B1Oct 12, 2004
Method to preserve alignment mark optical integrity
TAIWAN SEMICONDUCTOR MFG32 citations89
US6632590B1Oct 14, 2003
Enhance the process window of memory cell line/space dense pattern in sub-wavelength process
TAIWAN SEMICONDUCTOR MFG8 citations70
US7883926B2Feb 8, 2011
Methods for fabricating image sensor devices
TAIWAN SEMICONDUCTOR MFG4 citations63
US7863067B2Jan 4, 2011
Silicon substrate with reduced surface roughness
TAIWAN SEMICONDUCTOR MFG2 citations63
US7144773B1Dec 5, 2006
Method for preventing trenching in fabricating split gate flash devices
TAIWAN SEMICONDUCTOR MFG3 citations63
US8357561B2Jan 22, 2013
Method of fabricating backside illuminated image sensor
TAIWAN SEMICONDUCTOR MFG1 citations61
US7923344B2Apr 12, 2011
Method of fabricating backside illuminated image sensor
TAIWAN SEMICONDUCTOR MFG4 citations61
USRE41697ESep 14, 2010
Method of forming planarized coatings on contact hole patterns of various duty ratios
TAIWAN SEMICONDUCTOR MFG4 citations61
US8048807B2Nov 1, 2011
Method and apparatus for thinning a substrate
TAIWAN SEMICONDUCTOR MFG2 citations59
US7732299B2Jun 8, 2010
Process for wafer bonding
TAIWAN SEMICONDUCTOR MFG6 citations58
US9356108B2May 31, 2016
Dummy structure for multiple gate dielectric interface and methods
TAIWAN SEMICONDUCTOR MFG0 citations49
US8053853B2Nov 8, 2011
Color filter-embedded MSM image sensor
TAIWAN SEMICONDUCTOR MFG0 citations49
VANGUARD INT SEMICONDUCT CORP
4 patentsUS6077756AJun 20, 2000
Overlay target pattern and algorithm for layer-to-layer overlay metrology for semiconductor processing
VANGUARD INT SEMICONDUCT CORP262 citations98
US5985363ANov 16, 1999
Method of providing uniform photoresist coatings for tight control of image dimensions
VANGUARD INT SEMICONDUCT CORP57 citations94
US5982044ANov 9, 1999
Alignment pattern and algorithm for photolithographic alignment marks on semiconductor substrates
VANGUARD INT SEMICONDUCT CORP40 citations92
US5677001AOct 14, 1997
Striation-free coating method for high viscosity resist coating
VANGUARD INT SEMICONDUCT CORP34 citations92