Inventor
OGAWA SUMIO
JP19 patents
⚠️ This page may combine multiple inventors who share the name “OGAWA SUMIO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ELPIDA MEMORY INC
7 patentsUS7952950B2May 31, 2011
Semiconductor device including anti-fuse circuit, and method of writing address to anti-fuse circuit
ELPIDA MEMORY INC14 citations84
US7755163B2Jul 13, 2010
Antifuse element and semiconductor device including same
ELPIDA MEMORY INC10 citations83
US7613056B2Nov 3, 2009
Semiconductor memory device
ELPIDA MEMORY INC4 citations63
US7417908B2Aug 26, 2008
Semiconductor storage device
ELPIDA MEMORY INC2 citations63
US7550788B2Jun 23, 2009
Semiconductor device having fuse element arranged between electrodes formed in different wiring layers
ELPIDA MEMORY INC5 citations62
US7359263B2Apr 15, 2008
Chip information managing method, chip information managing system, and chip information managing program
ELPIDA MEMORY INC4 citations62
US7868417B2Jan 11, 2011
Semiconductor device including a plurality of fuse elements and attenuation members between or around the plurality of fuse elements
ELPIDA MEMORY INC0 citations51
NEC CORP
6 patentsUS6532182B2Mar 11, 2003
Semiconductor memory production system and semiconductor memory production method
NEC CORP29 citations92
US6349240B2Feb 19, 2002
Semiconductor device manufacturing system and method of manufacturing semiconductor devices
NEC CORP41 citations91
US5371707ADec 6, 1994
Dynamic random access memory device equipped with dummy cells implemented by enhancement type transistors
NEC CORP17 citations81
US6191987B1Feb 20, 2001
Semiconductor memory test circuit
NEC CORP11 citations73
US5570318AOct 29, 1996
Semiconductor memory device incorporating redundancy memory cells
NEC CORP11 citations73
US5485427AJan 16, 1996
Dynamic random access memory device equipped with dummy cells implemented by enhancement type transistors
NEC CORP4 citations62