Inventor

MONTIERTH DENNIS

US2 patents

Patents

2 patents

US9496050B2Nov 15, 2016

Methods and apparatuses for stacked device testing

MICRON TECHNOLOGY INC3 citations65

US11646751B2May 9, 2023

Apparatuses, systems, and methods for identifying multi-bit errors

MICRON TECHNOLOGY INC0 citations48