Inventor

TIWARI RAJESH KUMAR

IN3 patents

⚠️ This page may combine multiple inventors who share the name “TIWARI RAJESH KUMAR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HALES ALAN DAVID

1 patent

US8205125B2Jun 19, 2012

Enhanced control in scan tests of integrated circuits with partitioned scan chains

HALES ALAN DAVID40 citations86

TEXAS INSTRUMENTS INC

1 patent

US11333707B2May 17, 2022

Testing of integrated circuits during at-speed mode of operation

TEXAS INSTRUMENTS INC3 citations67

RAVI SRIVATHS

1 patent

US8856601B2Oct 7, 2014

Scan compression architecture with bypassable scan chains for low test mode power

RAVI SRIVATHS3 citations54