Inventor

FUJII TOSHIAKI

JP64 patents

⚠️ This page may combine multiple inventors who share the name “FUJII TOSHIAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FUJII TOSHIAKI

SII NANOTECHNOLOGY INC

Method of making lamina specimen

Charged particle beam apparatus

Apparatus for processing and observing a sample

Ion beam apparatus, ion beam processing method and sample holder member

Composite charged-particle beam system

Apparatus for working and observing samples and method of working and observing cross sections

Focused ion beam apparatus and sample section forming and thin-piece sample preparing methods

Ion beam device and ion beam processing method

Network system for controlling independent access to stored data among local area networks

EBARA RES CO LTD

Photoelectron emitting member and method of electrically charging fine particles with photoelectrons

Method and apparatus for the preparation of clean gases

Stocker

Method for cleaning closed spaces with ultraviolet rays

Photoelectron emitting member

Method and apparatus for the preparation of clean gases

Method and apparatus for the preparation of clean gases

Method and apparatus for the preparation of clean gases

Method and apparatus for the preparation of clean gases

SEIKO INSTR INC

Focused ion beam apparatus and method

Focused ion beam machining method and device thereof

Focused ion beam optical axis adjustment method and focused ion beam apparatus

Sample transfer apparatus and sample stage

Section formation observing method

Focused ion beam lithography method with sample inspection through oblique angle tilt

Focused ion beam optical axis adjustment method and focused ion beam apparatus

Focused ion beam apparatus

EBARA CORP

Method of and apparatus for cleaning air by irradiation of ultraviolet rays

Method and apparatus for removing particles from surface of article

Method and apparatus for purifying a gas containing contaminants

Method of cleaning gases

Method for removing particles from surface of article

Method for removing particles from a surface of an article

Chemical vapor deposition method and chemical vapor deposition apparatus

Carrier box for semiconductor substrate

HONDA MOTOR CO LTD

Airplane fuel supply system and airplane wing pipeline assembly method

Method for producing fiber-reinforced resin bonded body

Resin composite structure and method for producing the same

NEC CORP

Event driven logic simulator for partial simulation

Radio communication system and destination portable terminal time identification method

JAPAN ATOMIC ENERGY RES INST

Process for producing gas adsorbent

Acidic gas adsorber having a metal phthalocyanine on an ion exchanger

KITAHARA MASAKI

Video encoding method and decoding method by using selected parallax for parallax compensation, apparatuses therefor, programs therefor, and storage media for storing the programs

JEOL LTD

TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope

HITACHI HIGH-TECH SCIENCE CORP

Sample processing evaluation apparatus

CCI CORP

Skin preparations for external use

NIPPON ZEON CO

Positive quinone diazide sulfonic acid ester resist composition containing select hydroxy compound additive

HASUDA MASAKATSU

Electron microscope and specimen analyzing method

HITACHI HIGH TECH SCIENCE CORP

Crystal analysis apparatus, composite charged particle beam device, and crystal analysis method

TANAKA KEIICHI

Sample processing and observing method

PLASMA ION ASSIST CO LTD

Separator for fuel cell or current collecting member for fuel cell, and solid polymer electrolyte fuel cell