Inventor
KOZAKEVICH FELIX
US42 patents
⚠️ This page may combine multiple inventors who share the name “KOZAKEVICH FELIX”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LAM RES CORP
38 patentsUS9852889B1Dec 26, 2017
Systems and methods for controlling directionality of ions in an edge region by using an electrode within a coupling ring
LAM RES CORP135 citations99
US10115568B2Oct 30, 2018
Systems and methods for controlling directionality of ions in an edge region by using an electrode within a coupling ring
LAM RES CORP57 citations98
US6303044B1Oct 16, 2001
Method of and apparatus for detecting and controlling in situ cleaning time of vacuum processing chambers
LAM RES CORP186 citations98
US6017414AJan 25, 2000
Method of and apparatus for detecting and controlling in situ cleaning time of vacuum processing chambers
LAM RES CORP186 citations98
US6071573AJun 6, 2000
Process for precoating plasma CVD reactors
LAM RES CORP132 citations97
US9595424B2Mar 14, 2017
Impedance matching circuit for operation with a kilohertz RF generator and a megahertz RF generator to control plasma processes
LAM RES CORP50 citations96
US9761414B2Sep 12, 2017
Uniformity control circuit for use within an impedance matching circuit
LAM RES CORP38 citations94
US6016766AJan 25, 2000
Microwave plasma processor
LAM RES CORP54 citations94
US7169256B2Jan 30, 2007
Plasma processor with electrode responsive to multiple RF frequencies
LAM RES CORP60 citations93
US7749353B2Jul 6, 2010
High aspect ratio etch using modulation of RF powers of various frequencies
LAM RES CORP30 citations92
US7683289B2Mar 23, 2010
Apparatus and method for controlling plasma density profile
LAM RES CORP31 citations92
US7525787B2Apr 28, 2009
Electrostatic chuck assembly with dielectric material and/or cavity having varying thickness, profile and/or shape, method of use and apparatus incorporating same
LAM RES CORP29 citations92
US7430986B2Oct 7, 2008
Plasma confinement ring assemblies having reduced polymer deposition characteristics
LAM RES CORP28 citations92
US7144521B2Dec 5, 2006
High aspect ratio etch using modulation of RF powers of various frequencies
LAM RES CORP24 citations92
US5988187ANov 23, 1999
Chemical vapor deposition system with a plasma chamber having separate process gas and cleaning gas injection ports
LAM RES CORP22 citations92
US7405521B2Jul 29, 2008
Multiple frequency plasma processor method and apparatus
LAM RES CORP35 citations91
US5911833AJun 15, 1999
Method of in-situ cleaning of a chuck within a plasma chamber
LAM RES CORP49 citations90
US10283330B2May 7, 2019
Systems and methods for achieving a pre-determined factor associated with an edge region within a plasma chamber by synchronizing main and edge RF generators
LAM RES CORP14 citations86
US11195706B2Dec 7, 2021
Systems and methods for achieving a pre-determined factor associated with an edge region within a plasma chamber by synchronizing main and edge RF generators
LAM RES CORP7 citations84
US10615003B2Apr 7, 2020
Systems and methods for controlling directionality of ions in an edge region by using an electrode within a coupling ring
LAM RES CORP9 citations84
US10002746B1Jun 19, 2018
Multi regime plasma wafer processing to increase directionality of ions
LAM RES CORP8 citations84
US7393432B2Jul 1, 2008
RF ground switch for plasma processing system
LAM RES CORP19 citations84
US7276135B2Oct 2, 2007
Vacuum plasma processor including control in response to DC bias voltage
LAM RES CORP16 citations83
US9984859B2May 29, 2018
Impedance matching circuit for operation with a kilohertz RF generator and a megahertz RF generator to control plasma processes
LAM RES CORP15 citations82
US8000082B2Aug 16, 2011
Electrostatic chuck assembly with dielectric material and/or cavity having varying thickness, profile and/or shape, method of use and apparatus incorporating same
LAM RES CORP5 citations74
US11651991B2May 16, 2023
Electrostatic Chuck design for cooling-gas light-up prevention
LAM RES CORP2 citations73
US11069553B2Jul 20, 2021
Electrostatic chuck with features for preventing electrical arcing and light-up and improving process uniformity
LAM RES CORP2 citations73
US11024532B2Jun 1, 2021
Electrostatic chuck design for cooling-gas light-up prevention
LAM RES CORP1 citations73
US10825656B2Nov 3, 2020
Systems and methods for controlling directionality of ions in an edge region by using an electrode within a coupling ring
LAM RES CORP2 citations73
US10304662B2May 28, 2019
Multi regime plasma wafer processing to increase directionality of ions
LAM RES CORP5 citations73
US10115564B2Oct 30, 2018
Uniformity control circuit for use within an impedance matching circuit
LAM RES CORP3 citations73
US10083853B2Sep 25, 2018
Electrostatic chuck design for cooling-gas light-up prevention
LAM RES CORP2 citations73
US12255052B2Mar 18, 2025
Process control for ion energy delivery using multiple generators and phase control
LAM RES CORP0 citations62
US12183544B2Dec 31, 2024
Tuning voltage setpoint in a pulsed RF signal for a tunable edge sheath system
LAM RES CORP1 citations59
US12476082B2Nov 18, 2025
Radiofrequency signal filter arrangement for plasma processing system
LAM RES CORP0 citations52
US7521362B2Apr 21, 2009
Methods for the optimization of ion energy control in a plasma processing system
LAM RES CORP1 citations51
USRE38097EApr 29, 2003
Chemical vapor deposition system with a plasma chamber having separate process gas and cleaning gas injection ports
LAM RES CORP1 citations51
US12542257B2Feb 3, 2026
Minimizing reflected power in a tunable edge sheath system
LAM RES CORP0 citations48
DHINDSA RAJINDER
3 patentsUS8262922B2Sep 11, 2012
Plasma confinement rings having reduced polymer deposition characteristics
DHINDSA RAJINDER8 citations84
US8299390B2Oct 30, 2012
Apparatus and method for controlling plasma density profile
DHINDSA RAJINDER13 citations83
US8500952B2Aug 6, 2013
Plasma confinement rings having reduced polymer deposition characteristics
DHINDSA RAJINDER4 citations62