Inventor

YANOFSKY JARED P

US4 patents

⚠️ This page may combine multiple inventors who share the name “YANOFSKY JARED P”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

2 patents

US8987010B1Mar 24, 2015

Microprocessor image correction and method for the detection of potential defects

IBM10 citations79

US9209082B2Dec 8, 2015

Methods of localized hardening of dicing channel by applying localized heat in wafer kerf

IBM0 citations39

GLOBALFOUNDRIES INC

2 patents

US9412691B2Aug 9, 2016

Chip carrier with dual-sided chip access and a method for testing a chip using the chip carrier

GLOBALFOUNDRIES INC0 citations45

US9638581B2May 2, 2017

Determining thermal profiles of semiconductor structures

GLOBALFOUNDRIES INC0 citations33