Inventor
KLARE MARK
US11 patents
⚠️ This page may combine multiple inventors who share the name “KLARE MARK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NOVA MEASURING INSTR INC
6 patentsUS10533961B2Jan 14, 2020
Method and system for non-destructive metrology of thin layers
NOVA MEASURING INSTR INC5 citations82
US11029148B2Jun 8, 2021
Feed-forward of multi-layer and multi-process information using XPS and XRF technologies
NOVA MEASURING INSTR INC2 citations69
US10648802B2May 12, 2020
Feed-forward of multi-layer and multi-process information using XPS and XRF technologies
NOVA MEASURING INSTR INC2 citations69
US12066391B2Aug 20, 2024
Method and system for non-destructive metrology of thin layers
NOVA MEASURING INSTR INC0 citations61
US11668663B2Jun 6, 2023
Method and system for non-destructive metrology of thin layers
NOVA MEASURING INSTR INC0 citations61
US11733035B2Aug 22, 2023
Feed-forward of multi-layer and multi-process information using XPS and XRF technologies
NOVA MEASURING INSTR INC0 citations58
MICRON TECHNOLOGY INC
3 patentsUS5856698AJan 5, 1999
Second implanted matrix for agglomeration control and thermal stability
MICRON TECHNOLOGY INC19 citations92
US5739064AApr 14, 1998
Second implanted matrix for agglomeration control and thermal stability
MICRON TECHNOLOGY INC31 citations92
US6100189AAug 8, 2000
Second implant for agglomeration control
MICRON TECHNOLOGY INC8 citations73