Inventor

LEE HEON-HEE

KR3 patents

Patents

3 patents

US8539293B2Sep 17, 2013

Integrated circuit for compression mode scan test

LEE HEON-HEE14 citations78

US8677166B2Mar 18, 2014

Semiconductor devices and systems-on-chip having the same

LEE HEON-HEE2 citations57

US8779828B2Jul 15, 2014

Semiconductor device

LEE HEON-HEE0 citations47