Inventor

YONEKURA ISAO

JP4 patents

⚠️ This page may combine multiple inventors who share the name “YONEKURA ISAO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ADVANTEST CORP

1 patent

US9236218B2Jan 12, 2016

Defect inspection apparatus and method using a plurality of detectors to generate a subtracted image that may be used to form a subtraction profile

ADVANTEST CORP3 citations70

MURAKAWA TSUTOMU

1 patent

US8604431B2Dec 10, 2013

Pattern-height measuring apparatus and pattern-height measuring method

MURAKAWA TSUTOMU6 citations67

OGISO YOSHIAKI

1 patent

US8779359B2Jul 15, 2014

Defect review apparatus and defect review method

OGISO YOSHIAKI6 citations65

YONEKURA ISAO

1 patent

US8754935B2Jun 17, 2014

Microstructure inspection method, microstructure inspection apparatus, and microstructure inspection program

YONEKURA ISAO0 citations28