Inventor
WALLACK AARON
US36 patents
⚠️ This page may combine multiple inventors who share the name “WALLACK AARON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
COGNEX CORP
24 patentsUS6728582B1Apr 27, 2004
System and method for determining the position of an object in three dimensions using a machine vision system with two cameras
COGNEX CORP168 citations99
US6408109B1Jun 18, 2002
Apparatus and method for detecting and sub-pixel location of edges in a digital image
COGNEX CORP201 citations99
US6137893AOct 24, 2000
Machine vision calibration targets and methods of determining their location and orientation in an image
COGNEX CORP166 citations99
US5960125ASep 28, 1999
Nonfeedback-based machine vision method for determining a calibration relationship between a camera and a moveable object
COGNEX CORP174 citations99
US5768443AJun 16, 1998
Method for coordinating multiple fields of view in multi-camera
COGNEX CORP381 citations99
US6850646B1Feb 1, 2005
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP77 citations98
US6748104B1Jun 8, 2004
Methods and apparatus for machine vision inspection using single and multiple templates or patterns
COGNEX CORP78 citations98
US6690842B1Feb 10, 2004
Apparatus and method for detection and sub-pixel location of edges in a digital image
COGNEX CORP74 citations98
US6836567B1Dec 28, 2004
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP70 citations97
US7088862B1Aug 8, 2006
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP24 citations96
US7065262B1Jun 20, 2006
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP29 citations96
US6856698B1Feb 15, 2005
Fast high-accuracy multi-dimensional pattern localization
COGNEX CORP64 citations96
US5978081ANov 2, 1999
Multiple field of view calibration plate for use in semiconductor manufacturing
COGNEX CORP62 citations96
US5825483AOct 20, 1998
Multiple field of view calibration plate having a reqular array of features for use in semiconductor manufacturing
COGNEX CORP90 citations96
US7164796B1Jan 16, 2007
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP13 citations93
US7043081B1May 9, 2006
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP13 citations93
US7006712B1Feb 28, 2006
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP13 citations93
US6993192B1Jan 31, 2006
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP11 citations93
US6985625B1Jan 10, 2006
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP12 citations93
US6639624B1Oct 28, 2003
Machine vision methods for inspection of leaded components
COGNEX CORP31 citations92
US7058225B1Jun 6, 2006
Fast high-accuracy multi-dimensional pattern inspection
COGNEX CORP6 citations74
US9584730B2Feb 28, 2017
Apparatus, systems, and methods for a multi-position image sensor
COGNEX CORP6 citations72
US10360693B2Jul 23, 2019
High speed structured light system
COGNEX CORP4 citations71
US10803622B2Oct 13, 2020
High speed structured light system
COGNEX CORP1 citations60
COGNEX TECH & INVESTMENT CORP
6 patentsUS6681151B1Jan 20, 2004
System and method for servoing robots based upon workpieces with fiducial marks using machine vision
COGNEX TECH & INVESTMENT CORP356 citations98
US7171036B1Jan 30, 2007
Method and apparatus for automatic measurement of pad geometry and inspection thereof
COGNEX TECH & INVESTMENT CORP54 citations96
US6987875B1Jan 17, 2006
Probe mark inspection method and apparatus
COGNEX TECH & INVESTMENT CORP33 citations93
US6975764B1Dec 13, 2005
Fast high-accuracy multi-dimensional pattern inspection
COGNEX TECH & INVESTMENT CORP14 citations93
US7242801B1Jul 10, 2007
Image preprocessing for probe mark inspection
COGNEX TECH & INVESTMENT CORP12 citations84
US7957554B1Jun 7, 2011
Method and apparatus for human interface to a machine vision system
COGNEX TECH & INVESTMENT CORP15 citations82