Inventor

TAKANE EIJI

JP3 patents

⚠️ This page may combine multiple inventors who share the name “TAKANE EIJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NIKON CORP

2 patents

US5408083AApr 18, 1995

Method of measuring the best focus position having a plurality of measuring mark images and a plurality of focus positions

NIKON CORP36 citations90

US5475490ADec 12, 1995

Method of measuring a leveling plane

NIKON CORP13 citations71

NIKON CORPORATON

1 patent

US5525808AJun 11, 1996

Alignment method and alignment apparatus with a statistic calculation using a plurality of weighted coordinate positions

NIKON CORPORATON205 citations95