Inventor

KIM HEON C

US2 patents

⚠️ This page may combine multiple inventors who share the name “KIM HEON C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SILICON IMAGE INC

1 patent

US7698088B2Apr 13, 2010

Interface test circuitry and methods

SILICON IMAGE INC66 citations94

APPLE INC

1 patent

US12493076B2Dec 9, 2025

Scan data transfer circuits for multi-die chip testing

APPLE INC0 citations46