Inventor
FURUTA HIROSHI
JP59 patents
⚠️ This page may combine multiple inventors who share the name “FURUTA HIROSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC ELECTRONICS CORP
18 patentsUS7447950B2Nov 4, 2008
Memory device and memory error correction method
NEC ELECTRONICS CORP39 citations93
US6936891B2Aug 30, 2005
Semiconductor memory device and manufacturing method therefor
NEC ELECTRONICS CORP22 citations93
US7276956B2Oct 2, 2007
Integrated circuit apparatus controlling source voltage of MOSFET based on temperature
NEC ELECTRONICS CORP22 citations92
US7561390B2Jul 14, 2009
Protection circuit in semiconductor circuit device comprising a plurality of chips
NEC ELECTRONICS CORP10 citations84
US7772070B2Aug 10, 2010
Semiconductor integrated circuit device and dummy pattern arrangement method
NEC ELECTRONICS CORP18 citations82
US7214989B2May 8, 2007
Semiconductor device and semiconductor integrated circuit device
NEC ELECTRONICS CORP13 citations82
US7345346B2Mar 18, 2008
Field effect transistor having contact plugs in the source region greater than in the drain region
NEC ELECTRONICS CORP12 citations80
US6847561B2Jan 25, 2005
Semiconductor memory device
NEC ELECTRONICS CORP10 citations74
US7274616B2Sep 25, 2007
Integrated circuit apparatus
NEC ELECTRONICS CORP8 citations71
US7638849B2Dec 29, 2009
Semiconductor device having separated drain regions
NEC ELECTRONICS CORP2 citations63
US7473974B2Jan 6, 2009
Semiconductor circuit device including a protection circuit
NEC ELECTRONICS CORP4 citations63
US7394688B2Jul 1, 2008
Nonvolatile memory
NEC ELECTRONICS CORP3 citations63
US7808056B2Oct 5, 2010
Semiconductor integrated circuit device
NEC ELECTRONICS CORP6 citations61
US7743289B2Jun 22, 2010
Soft error rate calculation method and program, integrated circuit design method and apparatus, and integrated circuit
NEC ELECTRONICS CORP3 citations61
USRE41880EOct 26, 2010
Semiconductor memory device
NEC ELECTRONICS CORP0 citations52
US7719879B2May 18, 2010
Semiconductor integrated circuit
NEC ELECTRONICS CORP0 citations52
US7660085B2Feb 9, 2010
Semiconductor device
NEC ELECTRONICS CORP0 citations52
US7202150B2Apr 10, 2007
Semiconductor memory device and manufacturing method therefor
NEC ELECTRONICS CORP1 citations52
RENESAS ELECTRONICS CORP
6 patentsUS7989846B2Aug 2, 2011
Semiconductor device with three-dimensional field effect transistor structure
RENESAS ELECTRONICS CORP54 citations94
US7940577B2May 10, 2011
Semiconductor integrated circuit device minimizing leakage current
RENESAS ELECTRONICS CORP7 citations83
US7973371B2Jul 5, 2011
Semiconductor integrated circuit device including static random access memory having diffusion layers for supplying potential to well region
RENESAS ELECTRONICS CORP16 citations82
US8004306B2Aug 23, 2011
Semiconductor device
RENESAS ELECTRONICS CORP6 citations63
US7897999B2Mar 1, 2011
Semiconductor integrated circuit device
RENESAS ELECTRONICS CORP5 citations63
US8054705B2Nov 8, 2011
Semiconductor integrated circuit
RENESAS ELECTRONICS CORP1 citations51
KOCHI IND PROMOTION CT
5 patentsUS7993964B2Aug 9, 2011
Manufacturing method of semiconductor device including active layer of zinc oxide with controlled crystal lattice spacing
KOCHI IND PROMOTION CT214 citations98
US7598520B2Oct 6, 2009
Semiconductor device including active layer of zinc oxide with controlled crystal lattice spacing and manufacturing method thereof
KOCHI IND PROMOTION CT238 citations98
US7576394B2Aug 18, 2009
Thin film transistor including low resistance conductive thin films and manufacturing method thereof
KOCHI IND PROMOTION CT231 citations98
US7981734B2Jul 19, 2011
Manufacturing method of thin film transistor including low resistance conductive thin films
KOCHI IND PROMOTION CT90 citations97
US7977169B2Jul 12, 2011
Semiconductor device including active layer made of zinc oxide with controlled orientations and manufacturing method thereof
KOCHI IND PROMOTION CT125 citations97
TOSHIBA KK
5 patentsUS6538224B2Mar 25, 2003
Hybrid type gas insulation switch gear apparatus
TOSHIBA KK25 citations92
US7816924B2Oct 19, 2010
Gas insulated switchgear and method for detecting arc damage in a gas insulated switchgear part
TOSHIBA KK9 citations83
US6649853B2Nov 18, 2003
Combined type fluid pressure driving apparatus
TOSHIBA KK12 citations74
US6693250B2Feb 17, 2004
Hybrid gas insulation switchgear apparatus
TOSHIBA KK8 citations72
US6521855B2Feb 18, 2003
Hybrid gas insulation switchgear apparatus
TOSHIBA KK5 citations61
NEC CORP
4 patentsUS5416661AMay 16, 1995
Semiconductor integrated circuit device
NEC CORP37 citations93
US5285096AFeb 8, 1994
High stability static memory device having metal-oxide semiconductor field-effect transistors
NEC CORP42 citations93
US6335873B1Jan 1, 2002
Semiconductor integrated circuit device
NEC CORP40 citations91
US6760204B2Jul 6, 2004
Semiconductor integrated circuit device and method for designing the same
NEC CORP2 citations60
JVC KENWOOD CORP
4 patentsUS9319587B2Apr 19, 2016
Image pickup apparatus, image pickup method, and computer program product
JVC KENWOOD CORP14 citations81
US9972342B2May 15, 2018
Terminal device and communication method for communication of speech signals
JVC KENWOOD CORP2 citations70
US10418958B2Sep 17, 2019
Radio communication device
JVC KENWOOD CORP0 citations52
US10164680B2Dec 25, 2018
Radio communication device
JVC KENWOOD CORP0 citations52
FURUTA HIROSHI
4 patentsUS8546851B2Oct 1, 2013
Semiconductor integrated circuit device
FURUTA HIROSHI7 citations79
US8399954B2Mar 19, 2013
Semiconductor integrated circuit device
FURUTA HIROSHI6 citations73
US8169037B2May 1, 2012
Semiconductor integrated circuit including transistor having diffusion layer formed at outside of element isolation region for preventing soft error
FURUTA HIROSHI3 citations60
US8445943B2May 21, 2013
Semiconductor integrated circuit device
FURUTA HIROSHI0 citations52
SHIMOGAWA KENJYU
2 patentsTOSOH CORP
1 patentKANAZAWA YUKIO
1 patentShowing the top 50 of 59 patents by PatentIndex Score.